The Effective Free Classifieds

Condition:

- Fully Refurbished by many years experienced technicians.
- Guaranteed to meet or exceed OEM specifications
- 3 MONTH warranty and specifications guarantee.
- Installation, training, service, and support available worldwide!

A Cold Field Emission Gun Scanning Electron Microscope (FEGSEM) of "below-the-lens" design capable of (manufacturer's claims) 1.5 nm resolution at 15 kV, 12 mm W.D.; and 2.5 nm resolution at 1 k, 2.5 mm W.D. Magnification ranges from 30X to 500,000X. Specimen tilt at 12 mm W.D up to 45 degrees. Electron source is a cold FE gun producing high brightness (~ 2 X 109 A / cm2/sr) with little energy spread (0.2 - 0.3 eV). The "below-the-lens" design and large sample chamber port permits samples as large as 100 mm diameter X 17 mm thick H. Oil-free vacuum systems pump column and sample exchange. Available image modes include secondary and backscattered electron images. There are two secondary electron detectors; one above the objective lens, the other below. Digital images may be acquired in BMP, TIFF, or JPEG file formats at 640 X 480, 1280 X 960, or 1560 X 1920 pixels.

An Emitech cryo stage is available for use with samples prepared in the Emitech K-1250 Cryopreparation / Cryotransfer System shown below.

Equipment / Accessories
Hitachi S-4700 with a variety of non-cryo sample holders
CryoSEM observation using Emitech Cryo Stage, Model K-1250 Cryopreparation System, and a variety of sample holders
Backscatter imaging at TV rates and low voltage (threshold 2.5 kV on gold) with Autrata modified YAG (yttrium aluminum garnet, cerium doped) crystal
Keithly Specimen Current Detector
Applications
High-resolution topographic contrast (Se) and atomic number contrast (BSe) imaging of biological and non-biological samples in both room temperature and cryo modes
Applicable to imaging of immunogold labeled individual cells and bacteria
Specifications
Secondary electron image resolution
2.1 nm guaranteed (at 1 kV)
1.5 nm guaranteed (at 15 kV and W.D. 12 mm or X-ray analysis position)
Backscattered electron image resolution (optional)
3.0 nm guaranteed (at 15 kV YAG detector, optional)
Cold finger and specimen exchange chamber as standard. Allowing sample exchange via airlock without repositioning
Optional integrated EDX system with 30 degree take-off angle
Fully digital imaging, image processing and archiving system
Dual SE detectors for versatile imaging (SE and BSE)
ExB energy filter
The S-4700 FE-SEM combines the versatility of PC control with a novel electron optical column to give exceptional performance on large and small specimens. Resolution of 1.5nm at 15kV is guaranteed at the EDX and specimen exchange position of 12mm working distance!

The S-4700 also offers excellent low kV performance with guaranteed resolution of 2.1 nm at 1 kV, at a working distance of 1.5mm. Two versions, Type I and Type II, are available, differing in the specimen stage size. The S-4700 Type II features a five axis eucentric motorized stage which will accommodate specimens up to 150 mm in diameter.

Pre-programmed operating modes allow the user to switch from high-resolution conditions to microanalysis conditions at the click of the mouse with no change of objective aperture. The fully integrated new ExB filter opens the door to low voltage, high resolution, backscattered imaging never before possible on a conventional SEM.
Sample tilt of 45 degrees without change in working distance
Convenient and useful beam shift of +/-15um
Electron optics
Electron gun Cold field emission electron source
Acc. Voltage 0.5
30 kV (variable at 0.1 kV/step)
Probe current 1 pA
2 nA (depends on Acc. voltage)
Magnification x 20
x 500,000
Objective aperture Heated aperture, 4-openings, selectable and alignable outside the vacuum
Specimen Size 2" 4" or 6"
Specimen stage Type I Type II
Traverse X: 0 0
25 mm 100 mm
Y: 0 0
25 mm 50 mm
Z: 1.5 1.5
26.5 mm 30.0 mm
T: -5 -5
+45 degrees +60 degrees
R: 360 degrees 360 degrees
Drive: Manual PC-controlled 5 axis
motor drive
Image display
Operation/display­ PC/AT compatible, OS: Windows 2000(R)*
Large color CRT
Scan mode Normal, Split/dual mag./line scan, position
set, spot, AAF, SAA, oblique
Frame memory 640 x 480 pixels, 1,280 x 960 pixels,
2,560 x 1,920 pixels
Image filing Image data base with various reference
functions built-in
Image file format BMP, TIFF, JPEG selectable
Scan speed TV, slow (0.5 ~ 40 s/frame) for viewing
Slow (40 ~ 320 s/frame) for recording
Image processing Automatic image brightness & contrast,
raster rotation, autofocus, auto-stigmation,
averaging, frame integration, color display
Auto data recording Film numbering, acc. voltage, micron bar
with a scale, magnification, date, hours and
working distance
Electrical image shift
±15 µm (at W.D. = 12 mm)
Vacuum system
System Automatic vacuum sequence
with pneumatic valve controls
Vacuum 10-7 Pa (electron gun),

10-4 Pa (specimen chamber)

Pumps Fore pumps 140 l/min (168 l/min)
x 2 sets, ( ) is for 60 Hz operation.
Diffusion pump 570 l/s x 1 set,
and Ion pumps x 3 sets
Protection System protection against power,
water and vacuum failures.

Please contact us for more information by sales@allwin21.com­

SEM:
Zeiss/Leo 435VP - W SEM, variable pressure
Zeiss/Leo DSM982 FE SEM
Hitachi S-4500 - FE SEM, Type I and Type II
Hitachi S-4700 - FE SEM, Type II
Hitachi S-4800 - FE SEM, Type II

CD/SEM:
Hitachi S-8820 for 5", 6" or 8", Silicon or GaAs wafers
Hitachi S-8840 for 5", 6" or 8" , Silicon or GaAs wafers
Hitachi S-9300 for 6", 8" or 12 " Silicon wafers

FIB:
FEI/Micrion M9100 Workstation, Gas box optional
FEI/Micrion M9500 Workstation, Gas box optional
Seiko 8300 FIB
Seiko 8100 FIB

E-mail